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ATF4 Sensor

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聯(lián)系方式:西努光學(xué)查看聯(lián)系方式

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西努光學(xué)創(chuàng)建于2003 年,主營(yíng)工業(yè)顯微鏡及制樣設(shè)備、鏡片測(cè)定設(shè)備,高速攝像系統(tǒng)、工業(yè)內(nèi)窺鏡、機(jī)器視覺等工業(yè)及科研應(yīng)用的檢測(cè)設(shè)備及系統(tǒng)集成。
西努光學(xué)秉承“以光學(xué)為核心,為客戶提供解決方案”的經(jīng)驗(yàn)思路,經(jīng)過16年的努力,成為眾多企業(yè)、高??蒲袉挝惶峁└鞣N專業(yè)化的光學(xué)系統(tǒng)解決方案。并于2012 年導(dǎo)入SAP 管理系統(tǒng),通過系統(tǒng)資源整合,為客戶提供更優(yōu)質(zhì)、快捷的專業(yè)化服務(wù)。
2016 年,我們積極引進(jìn)檢測(cè)設(shè)備的同時(shí)導(dǎo)入制樣等配套設(shè)備以豐富我們實(shí)驗(yàn)室平臺(tái),以更好的為客戶提供現(xiàn)場(chǎng)體驗(yàn),從微米到納米滿足客戶從制樣到結(jié)果分析的一站式體驗(yàn)服務(wù)。

 

 

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The ATF4 Sensor
WDI’s ATF4 is a high speed, high accuracy, autonomous digital autofocus sensor. Its “Smart Sensor Architecture” (SSA) incorporates a semiconductor laser, built-in CMOS image sensor, FPGA and microprocessor for fast digital image processing. By projecting a laser dot onto the sample and digitally processing the image, the ATF4 provides fast and accurate measurements of the distance and direction to focus. This information can then be output directly to WDI’s MCM+ or MCZ controller, or to any compatible controller.
High Accuracy At Fast Speeds
WDI’s ATF4 sensors project their focusing laser directly through the objective lens of the microscope. This “Through The Lens” (TTL) technique allows the ATF4 to provide extremely accurate autofocus, with a success rate typically higher than 99%. The ATF4’s on-board digital processing allows it to couple this accuracy with extremely high speeds, typically achieving focus in less than 0.6 seconds.
Tracking Autofocus
The ATF4 continually assesses both the distance and direction to focus, updating its data every 0.5 milliseconds. This allows the sensor to keep samples in focus regardless of whether they are stationary or in motion. This powerful tracking autofocus makes the ATF4 perfect for scanning very large specimens quickly and precisely.
Maximum Flexibility
The ATF4 sensor is designed to automatically adjust its laser intensity as well as the image sensor’s exposure time, allowing it to adapt to a wide variety of specimens, from low reflectivity (down to 1%) to highly reflective (up to 99%). It operates very well on plane reflective surfaces such as glass and unpatterned Si wafer. It is compatible with objective lenses from 2X to 100X magnification, and wavelengths including UV, NUV and NIR. The ATF4 includes Laser Enable and Camera Sync features for automatically suspending the laser.
Easy Integration
All of the sensors in WDI’s ATF family are designed with ease of integration in mind. They are compatible with most types
of infinity corrected microscope objectives. The ATF4 can be purchased as either a stand-alone sensor with analog output, or as full autofocus system, integrated with either WDI’s MCM+ controller for driving an external Z stage or MCZ controller which includes the ability to drive a two-phase stepper motor for Z actuation. All WDI’s ATF sensors have small, standardized footprints and connections, and can output in either analog or digital formats, making them both easy to install and easy to upgrade as application requirements evolve.
 

 ATF4 SensorAUTO FOCUS & SCANNING SENSOR

 

Structured Light PatternSingle Dot
Sensor WavelengthChoice of 660nm, 785nm or 850nm
Image DetectorLine Scan CMOS
Autofocus Update Rate1.2kHz
Static Autofocus Accuracy± 1/4 Objective Depth of Focus
Fast Tracking Autofocus Accuracy± 1/2 Objective Depth of Focus

 

General Performance
Reflectivity Adaption Delay1ms
Laser TypeSemiconductor
Laser SafetyClass 2
Weight250g
Dimensions40 X 40 X 120mm
Maximum Cable Length1.8m
ComplianceCE SEMI
External Requirements
Specimen Reflectivity1% ~ 99%
Glass Thickness> 0.5mm
Diffusing SpecimenNo
Specular SpecimenYes
Patterned SpecimenNo
Textured SpecimenNo
Operating Specifications
Input Voltage18V ~ 25V, 24V Nominal
Operating Temperature18°C ~ 35°C
Storage Temperature10°C ~ 45°C
Humidity10% ~ 75% Non Condensing

 

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